Soft X-ray holographic microscopy with 300 nm resolution

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 587-590

  Chen, J ^a   Gao, H ^a   Jiang, S ^a   Xie, H ^a   Xu, Z ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HOLOGRAMS; IMAGE RECONSTRUCTION; NUMERICAL METHODS; OPTICAL RESOLVING POWER; PHOTORESISTS; POLYMETHYL METHACRYLATES; X RAY MICROSCOPES; X RAY OPTICS;

DIGITIZED HOLOGRAM; GABOR IN-LINE HOLOGRAPHY; X RAY HOLOGRAPHIC MICROSCOPY; X RAY IN-LINE HOLOGRAMS;

HOLOGRAPHY;

EID: 0038363735     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030150     Document Type: Conference Paper

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