Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles

Journal of Electron Spectroscopy and Related Phenomena

Volumn 129, Issue 2-3, 2003, Pages 243-271

  Demortier, Guy ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Alloys; Archaeological material; Depth distribution; NRA; PIXE; RBS

Indexed keywords

ALLOYS; CHARGED PARTICLES; FLUORESCENCE; ION BEAMS; KINETIC ENERGY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY ANALYSIS; X RAYS;

DEPTH PROFILING; PARTICLE INDUCED X-RAY EMISSION (PIXE);

SOLIDS;

EID: 0038616225     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(03)00077-X     Document Type: Article

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