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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 189, Issue 1-4, 2002, Pages 400-407

Quantitative PIXE trace element imaging of minerals using the new CSIRO-GEMOC Nuclear Microprobe

(5) Ryan, C G a,b Van Achterbergh, E a,b Yeats, C J a Tin Win, Tin a Cripps, G a

a CSIRO (Australia)

b MACQUARIE UNIVERSITY (Australia)

Author keywords

Geological applications; Ion beam analysing; Nuclear Microprobe; PIXE; Proton microprobe; Quantitative imaging

Indexed keywords

COMPOSITION EFFECTS; COMPUTER SOFTWARE; IMAGING TECHNIQUES; MINERALS; PROTONS; SILICATES; TRACE ELEMENTS; X RAY ANALYSIS;

NUCLEAR MICROPROBES; PROTON-INDUCED X-RAY EMISSION (PIXE);

NUCLEAR INSTRUMENTATION;

EID: 0036535355 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(01)01098-9 Document Type: Conference Paper

Times cited : (57)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.