On the experimental determination of the Fano factor in Si at soft X-ray wavelengths

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 491, Issue 3, 2002, Pages 437-443

  Owens, Alan ^a   Fraser, G W ^b   McCarthy, Kieran J ^c  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b UNIVERSITY OF LEICESTER   (United Kingdom)

^c CIEMAT   (Spain)

Author keywords

Fano factor; Semiconductors; X rays

Indexed keywords

CHARGE COUPLED DEVICES; ENERGY DISSIPATION; PHOTOIONIZATION; SEMICONDUCTING SILICON; SYNCHROTRON RADIATION; X RAYS;

FANO FACTOR;

PARTICLE DETECTORS;

EID: 0036788928     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01178-6     Document Type: Article

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6. Roper M., Buksh P., Kirkman I., van der Laan G., Padmore H. Rev. Sci. Instr. 63:1992;1322.
7. McCarthy K.J., Owens A., Holland A., Wells A. Nucl. Instr. and Meth. A. 362:1995;538.