Surface sensitive particle-induced X-ray emission

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 189, Issue 1-4, 2002, Pages 49-55

  Lennard, W N ^a   Kim, J K ^a   Rodriguez Fernandez L ^b  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Depth profiling; Grazing exit; Particle induced X ray emission; Surface spectroscopy

Indexed keywords

CHARGED PARTICLES; ELECTROMAGNETIC WAVE EMISSION; FLUORESCENCE; PHOTONS; SURFACE PHENOMENA; X RAY PRODUCTION;

ELECTRON PROBE MICROANALYSIS (EPMA); PARTICLE INDUCED X-RAY EMISSION (PIXE);

TRACE ELEMENTS;

EID: 0036536493     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00993-4     Document Type: Conference Paper

References (20)