Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

Journal of Analytical Atomic Spectrometry

Volumn 18, Issue 4, 2003, Pages 350-357

  Kempenaers, L ^a   Janssens, K ^a   Jochum, K P ^b   Vincze, L ^a   Vekemans, B ^a   Somogyi, A ^a   Drakopoulos, M ^c   Adams, F ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b Mcix Planck Institut für Chemie   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; FLUORESCENCE; HEAVY METALS; TRACE ELEMENTS; X RAY SPECTROSCOPY;

MICRO-HETEROGENEITY; X-RAY FLUORESCENCE ANALYSIS;

EMISSION SPECTROSCOPY;

EID: 0038035370     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b212196d     Document Type: Article

References (37)

1. L. Moenke-Blankenburg, Laser Microanalysis, Wiley, New York, 1989, vol. 105.
2. T. E. Jeffries, in Non-destructive Elemental Analysis, ed. Z. B. Alfassi, Blackwell Science, Oxford, 2001, ch. 3, pp. 115-150.
3. R. S. Houk, Laser Ionization Techniques for Analytical Mass Spectromectry in Analytical Applications of Lasers, Wiley, New York, 1986.
4. E. Hoffmann, C. Ludke and H. Stephanowitz, Fresenius' J. Anal. Chem., 1996, 355, 900-903.
5. J. M. Vadillo, S. Palanco, M. D. Romero and J. J. Laserna, Fresenius' J. Anal. Chem., 1996, 355, 909-912.
6. L. J. Radziemski, R. W. Solarz and J. A. Paisner, Laser Spectrcopy and its Applications, Dekker, New York, 1987.
7. K., Janssens, L. Vincze, J. Rubio and F. Adams, J. Anal. At. Spectrom, 1994, 9, 151-157.
8. K. Janssens, L. Vincze, F. Adams and K. W. Jones, Anal Chim Acta, 1993, 283, 98-119.
9. K. Janssens, L. Vincze, B Vekemans, A. Aerts, F. Adams, K. W. Jones and A. Knöchel, Microchim Acta, 1996, 13, 87-115.
10. Z. B. Alfassi, Chemical Analysis by Nuclear Methods, Wiley, New York, 1994.
11. S. A. E. Johansson and J. L. Campbell, PIXE: A Novel Technique for Elemental Analysis, Wiley, New York, 1988
12. R. W. Hinton, in Microprobe Techniques in the Earth Sciences, Chapman and Hall, London, 1995, pp. 235-289.
13. L. Ottolini, P. Bottazzi and R. Vannucci, Anal. Chem, 1993, 65, 1960-1968.
14. G. A. Jenner, S. F. Foley, S. E. Jackson, T. H. Green, B. J. Freyer and H. P. Loncerich, Geochim Cosmochim. Acta, 1994, 58, 5099-5103.
15. J. S. Kane, Geostand Newsl, 1998, 22, 15-31.
16. USGS, United Slates Geological Survey Special Bulletin (Reference Materials Project), United States Geological Survey, Preliminary Report, 1996, pp. 10.
17. K. P. Jochum, D. B. Dingwell, A. W. Hoffmann, B. Stoll, I. Raczek, A. Rocholl, S. Becker, A. Besmehn, D. Besette, H. J. Dietze, P. Dulski, J. Erzinger, E. Hellebrand, P. Hoppe, I. Horn, K. Janssens, G. Jenner, W. M. McDonough, M. Maetz, I. K. Nikogosian, C. Pickhardt, H. M. Seufert, S. G. Simakin, A. V. Sobolev, B. Spettel, S. Straub, L. Vincze, A. Wallianos, G. Weckwerth, D. Wolf and M. Zimmer, Geostand Newsl, 2000, 24, 87-133.
18. H. E. Newsom, W. M. White, K. P. Jochum and A. W. Hofmann, Earth Planet. Sci. Lett, 1986, 80, 299-313.
19. L. M. Echeverria, Contrib. Mineral Petrol, 1980, 73, 253-266.
20. W. Obermiller, PhD thesis, Universitat Mainz, 1994.
21. C. Hémond, N. T. Arndt, U. Lichtenstein, A. W. Hofmann, N. Oskarsson and S Steinthorsson, J Geophys. Res, 1993, 98, 15833-15850.
22. M. Klein, H. G. Stosch and H. A. Seck, Chem Geol., 1997, 138, 257-271.
23. D. Dmgwell, N. Bagdassarov, N. Bussod and S. L. Webb, Mineralogical Association of Canada Short Course on Experiments at High Pressure, 1993, pp. 131-196.
24. L. Kempenaers, L. Vinczc and K. Janssens, Spectrochim. Acta, Part B, 2000, 55, 651-669.
25. L. Kempenaers, C. De Koster, W. Van Borm and K. Janssens, Fresenius' J. Anal. Chem, 2001, 369, 733-737.
26. L. Kempenaers, K. Janssens, L. Vincze, B. Vekemans, A. Somogyi, M. Drakopoulos, A Simionovici and F. Adams, Anal Chem, 2002, 74, 5017-5026.
27. National Institute of Standards and Technology, Certificate of Analysis, Standard Reference Material 613 'Trace Elements in 1 mm Glass Wafer', January 1992, Washington DC, USA.
28. A. Somogyi, M. Drakopoulos, L. Vincze, B. Vekemans, C. Camerani, K. Janssens, A. Snigirev and F. Adams, X Ray Spectrom, 2001, 30, 242-252.
29. P. Van Espen, K. Janssens and J. Nobels, Chemom Intell. Lab. Syst, 1986, 1, 109-114.
30. K. Danzer and L. Küchler, Talanta, 1977, 24, 561-565.
31. J. Pauwels and C. Vandecasteele, Fresemus' J. Anal Chem, 1993, 345, 121-123
32. K. Danzer, Spectrochim Acta. Part B, 1984, 39, 949-954.
33. K. Janssens, F. Adams and A. Rindby, in Microscopic X-ray Fluorescence Analysts, Wiley, New York, 2000, 182-183.
34. J. D. Jobson, in Applied Multivariate Data Analysis, Springer, NY, 1991, vol. 1.
35. M. G. Natrella, Experimental Statistics, NBS Handbook 91, National Bureau of Standards, Washington DC, 1996.
36. L. Kempenaers, N. H. Bings, T. E. Jeffries, B. Vekemans and K. Janssens, J. Anal At Spectrom., 2001, 16, 1006-1011.
37. S. M. Eggins and J. M. G. Shelly, Geostand Newsl., 2002, 26, 269-286