Behavior of the continuous X-ray background in grazing-exit electron probe X-ray microanalysis

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 56, Issue 12, 2001, Pages 2497-2504

  Tsuji, K ^a   Spolnik, Z ^a   Wagatsuma, K ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Critical energy; Grazing exit EPMA; Si and Au substrates; X Ray background behaviour

Indexed keywords

FLUORESCENCE; GOLD; SILICON; SUBSTRATES;

ELECTRON PROBE X-RAY MICROANALYSIS (EPMA);

X RAY SPECTROSCOPY;

EID: 0035841921     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(01)00347-0     Document Type: Article

References (10)

1. A formula for the background in TXRF as a function of the incidence angle and substrate material
2. Grazing-emission X-ray fluorescence spectrometry; principles and applications
3. Grazing exit electron probe microanalysis for surface and particle analysis
4. Enhancement of electron-induced X-ray intensity for single particles under grazing exit conditions
5. Quantitative analysis of metallic ultra-thin films by grazing-exit electron probe X-ray microanalysis
6. New experimental equipment for grazing-exit electron probe microanalysis (GE-EPMA)
7. Surface studies by Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
8. X-ray evanescent-wave absorption and emission