Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 482, Issue 1-3, 2002, Pages 569-572

  Wobrauschek, P ^a   Streli, C ^a   Pepponi, G ^a   Bergmann, A ^b   Glatter, O ^c  

^a TU WIEN   (Austria)

^b ANTON PAAR GMBH   (Austria)

^c Institute of Chemistry   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; LIGHT ABSORPTION; MONOCHROMATORS; PARTICLE DETECTORS; SYNCHROTRON RADIATION; ABSORPTION; MULTILAYERS; PHOTONS; SCATTERING; X RAY CAMERAS; X RAY TUBES;

TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF);

X RAY SCATTERING; NUCLEAR INSTRUMENTATION;

TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS (TXRF);

EID: 6444245341     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0168-9002(02)00463-1     Document Type: Article

References (7)

1. X-ray and inner-shell processes