Thermometry and thermal transport in micro/nanoscale solid-state devices and structures

Journal of Heat Transfer

Volumn 124, Issue 2, 2002, Pages 223-241

  Cahill, David G ^a   Goodson, Kenneth ^a   Majumdar, Arunava ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Conduction; Heat transfer; Interface; Measurement techniques; Microscale; Nanoscale; Thin films

Indexed keywords

BANDWIDTH; CARBON NANOTUBES; ELECTRIC RESISTANCE; ENERGY DISSIPATION; HEAT CONDUCTION; HEAT RADIATION; INTERFACES (MATERIALS); MICROMACHINING; SINGLE CRYSTALS; SOLID STATE DEVICES; THERMAL DIFFUSION; THICKNESS MEASUREMENT;

SCANNING THERMAL MICROSCOPY (STHM);

HEAT TRANSFER;

CONDUCTION; FILM THICKNESS; HEAT TRANSFER; INTERFACE; MEASUREMENT METHOD; THERMOMETRY;

EID: 0036536079     PISSN: 00221481     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1454111     Document Type: Article

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