Thermal conductivity of symmetrically strained Si/Ge superlattices

Superlattices and Microstructures

Volumn 28, Issue 3, 2000, Pages 199-206

  Borca Tasciuc, Theodorian ^a   Liu, Weili ^a   Liu, Jianlin ^a   Zeng, Taofang ^a   Song, David W ^a   Moore, Caroline D ^a   Chen, Gang ^a   Wang, Kang L ^a   Goorsky, Mark S ^a   Radetic, Tamara ^b   Gronsky, Ronald ^c   Koga, Takaaki ^d   Dresselhaus, Mildred S ^e,f  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c Lawrence Berkeley National Laboratory   (United States)

^d HARVARD UNIVERSITY   (United States)

^e MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^f USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL VARIABLES MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

DOPING EFFECT; THERMAL CONDUCTIVITY MEASUREMENT; THERMOELECTRICS PHONON ENGINEERING;

SEMICONDUCTOR SUPERLATTICES;

EID: 0034273743     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.2000.0900     Document Type: Article

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