Improved apparatus for picosecond pump-and-probe optical measurements

Review of Scientific Instruments

Volumn 67, Issue 8, 1996, Pages 2720-2726

  Capinski, William S ^a   Maris, Humphrey J ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000498148     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147100     Document Type: Article

References (15)

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6. C. Doland, W. B. Jackson, and A. Anderson, in Ultrafast Phenomena V, edited by G. R. Fleming and A. E. Siegman (Springer, Berlin, 1986), p. 86.
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10. Newport Corporation, Irvine, CA 92714.
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13. R. J. Stoner, H. J. Maris, T. R. Anthony, and W. F. Banholzer, Phys. Rev. Lett. 68, 1563 (1992); R. J. Stoner and H. J. Maris, Phys. Rev. B 48, 16373 (1993).
14. T. R. Anthony, W. F. Banholzer, J. R. Fleischer, L. Wei, P. K. Kuo, R. L. Thomas, and R. W. Pryor, Phys. Rev. B 42, 1104 (1990).
15. The film thickness could be determined by the picosecond ultrasonics technique as described in Ref. 11.