Scanning thermal microscopy: Subsurface imaging, thermal mapping of polymer blends, and localized calorimetry

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1486-1491

  Hammiche, A ^a   Hourston, D J ^b   Pollock, H M ^a   Reading, M ^c   Song, M ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^c Decorative Research and Development Department   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544277233     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589124     Document Type: Article

References (9)

1. M. Reading, Trends Polym. Sci. 1, 248 (1993).
2. C. C. Williams and H. K. Wickramasinghe, in Photoacoustic and Photothermal Phenomena, edited by P. Hess and J. Peltzl (Springer, Berlin, 1988), p. 364.
3. M. Nonnenmacher and H. K. Wickramasinghe, Appl. Phys. Lett. 61, 168 (1992).
4. A. Majumdar, J. P. Carrejo, and J. Lai, Appl. Phys. Lett. 62, 2501 (1993).
5. E. Österschulze and M. Stopka, Microelectron. Eng. (to be published).
6. R. B. Dinwiddie, R. J. Pylkki, and P. E. West, in Thermal Conductivity 22, edited by T. W. Tong (Technomics, Lancaster, PA, 1994), p. 668.
7. L. J. Balk, M. Maywald, and R. J. Pylkki, in Proceedings of the 9th Conference on Microscopy of Semiconducting Materials (to be published).
8. A. Hammiche, H. M. Pollock, M. Song, and D. J. Hourston, Meas. Sci. Technol. 7, 142 (1995).
9. A. Majumdar, J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi, Rev, Sci. Instrum. 66, 3584 (1995).