Thermal boundary resistance at Ge2Sb2Te5/ZnS:SiO2 interface

Applied Physics Letters

Volumn 76, Issue 26, 2000, Pages 3864-3866

  Kim, E K ^a   Kwun, S I ^a   Lee, S M ^b   Seo, H ^b   Yoon, J G ^c  

^a Seoul National University   (South Korea)

^b LG   (South Korea)

^c Suwon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001552921     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126852     Document Type: Article

References (20)

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