Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al

Applied Optics

Volumn 38, Issue 16, 1999, Pages 3614-3620

  Hostetler, John L ^a   Smith, Andrew N ^a   Czajkowsky, Daniel M ^b   Norris, Pamela M ^a  

^a University of Virginia   (United States)

^b UNIVERSITY OF VIRGINIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000189060     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.003614     Document Type: Article

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