Phonon scattering in silicon films with thickness of order 100 nm

Applied Physics Letters

Volumn 74, Issue 20, 1999, Pages 3005-3007

  Ju, Y S ^a   Goodson, K E ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001246055     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123994     Document Type: Article

References (23)

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