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Volumn 6, Issue 6, 2000, Pages 1244-1253

Long-wavelength vertical-cavity lasers and amplifiers

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG CELLS; LASER RESONATORS; MIRRORS; SILICON WAFERS;

EID: 0034313209     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.902174     Document Type: Article
Times cited : (83)

References (12)
  • 4
    • 0000687320 scopus 로고    scopus 로고
    • Low-threshold index-guided 1.5 μm long-wavelength vertical-cavity surface-emitting laser with high efficiency
    • M. Ortsiefer, R. Shau, G. Bohm, F. Kohler, and M. C. Amann, "Low-threshold index-guided 1.5 μm long-wavelength vertical-cavity surface-emitting laser with high efficiency," Appl. Phys. Lett., vol. 76, pp. 2179-2181, 2000.
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 2179-2181
    • Ortsiefer, M.1    Shau, R.2    Bohm, G.3    Kohler, F.4    Amann, M.C.5
  • 7
    • 0033313587 scopus 로고    scopus 로고
    • Room-temperature, electrically-pumped, multiple-active-region VCSELs with high differential efficiency at 1.55 μm
    • San Francisco, CA
    • J. K. Kim, E. Hall, O. Sjolund, and L. A. Coldren, "Room-temperature, electrically-pumped, multiple-active-region VCSELs with high differential efficiency at 1.55 μm," in Proc. IEEE Lasers and Electro-Optics Society Annu. Meeting, vol. 1, San Francisco, CA, 1999, pp. 141-142.
    • (1999) Proc. IEEE Lasers and Electro-Optics Society Annu. Meeting , vol.1 , pp. 141-142
    • Kim, J.K.1    Hall, E.2    Sjolund, O.3    Coldren, L.A.4
  • 8
    • 0032685221 scopus 로고    scopus 로고
    • Electrically-pumped, single-epitaxial VCSELs at 1.55 μm with Sb-based mirrors
    • E. Hall, G. Almuneau, J. K. Kim, O. Sjolund, H. Kroemer, and L. A. Coldren, "Electrically-pumped, single-epitaxial VCSELs at 1.55 μm with Sb-based mirrors," Electron. Lett., vol. 35, pp. 1337-1338, 1999.
    • (1999) Electron. Lett. , vol.35 , pp. 1337-1338
    • Hall, E.1    Almuneau, G.2    Kim, J.K.3    Sjolund, O.4    Kroemer, H.5    Coldren, L.A.6
  • 12
    • 21144484715 scopus 로고
    • In situ characterization of sputtered thin films using a normal incidence laser reflectometer
    • D. I. Babic, T. E. Reynolds, E. L. Hu, and J. E. Bowers, "In situ characterization of sputtered thin films using a normal incidence laser reflectometer," J. Vacuum Sci. Technol. A, pt. 1, vol. 10, no. 4, pp. 939-944, 1992.
    • (1992) J. Vacuum Sci. Technol. A, Pt. 1 , vol.10 , Issue.4 , pp. 939-944
    • Babic, D.I.1    Reynolds, T.E.2    Hu, E.L.3    Bowers, J.E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.