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Volumn 59, Issue 12, 1999, Pages 8105-8113

Thermal-conductivity measurements of gaas/alas superlattices using a picosecond optical pump-and-probe technique

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EID: 0000881998     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.8105     Document Type: Article
Times cited : (443)

References (45)
  • 3
    • 85037904006 scopus 로고    scopus 로고
    • B. Jusserand and M. Cardona, in Light Scattering in Solids V–Superlattices and Other Microstructures, edited M. Cardona and G. Güntherodt (Springer-Verlag, Berlin, 1989), Chap. 3, p. 49.
    • B. Jusserand and M. Cardona, in Light Scattering in Solids V–Superlattices and Other Microstructures, edited M. Cardona and G. Güntherodt (Springer-Verlag, Berlin, 1989), Chap. 3, p. 49.
  • 25
    • 85037877854 scopus 로고    scopus 로고
    • The value of (Formula presented) was assumed to be the same as the diffusivity of Al films prepared in a similar way in our lab. The diffusivity was calculated by using the Wiedemann-Franz relation. The resistivity of Al was measured by a four-point probe technique. The diffusivity at 300 K was calculated to be 0.45 (Formula presented) In order to obtain the low temperature value (0.62 (Formula presented) at 100 K) it was assumed that the decrease in the resistivity compared to bulk Al at 100 K would be the same as the change measured at 300 K. See Ref. 24
    • The value of (Formula presented) was assumed to be the same as the diffusivity of Al films prepared in a similar way in our lab. The diffusivity was calculated by using the Wiedemann-Franz relation. The resistivity of Al was measured by a four-point probe technique. The diffusivity at 300 K was calculated to be 0.45 (Formula presented) In order to obtain the low temperature value (0.62 (Formula presented) at 100 K) it was assumed that the decrease in the resistivity compared to bulk Al at 100 K would be the same as the change measured at 300 K. See Ref. 24.
  • 40
    • 0003680984 scopus 로고
    • R. Glang McGraw-Hill, New York Chap 8., L. I. Maissel
    • Handbook of Thin Film Technology, edited by L. I. Maissel and R. Glang (McGraw-Hill, New York, 1970), Chap 8.
    • (1970) Handbook of Thin Film Technology
  • 41
    • 0030368396 scopus 로고    scopus 로고
    • American Society of Mechanical Engineers, New York
    • G. Chen, in Micro-Electro-Mechanical Systems (American Society of Mechanical Engineers, New York, 1996), Vol. 59, pp. 13–24.
    • (1996) Micro-Electro-Mechanical Systems , vol.59 , pp. 13-24
    • Chen, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.