Scanning thermal microscopy of a vertical-cavity surface-emitting laser

Applied Physics Letters

Volumn 71, Issue 12, 1997, Pages 1604-1606

  Luo, K ^a   Herrick, R W ^b   Majumdar, A ^c   Petroff, P ^b  

^a Anadigics Inc   (United States)

^b University of California   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; MATHEMATICAL MODELS; MICROSCOPES; MIRRORS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; TEMPERATURE; TEMPERATURE DISTRIBUTION; THERMAL CONDUCTIVITY; THERMAL VARIABLES MEASUREMENT;

HEAT GENERATION; JOULE HEATING; SCANNING THERMAL MICROSCOPY; VERTICAL CAVITY SURFACE EMITTING LASER;

QUANTUM WELL LASERS;

EID: 0031235669     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119991     Document Type: Article

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