New aspects in electro-optic sampling

Microelectronic Engineering

Volumn 31, Issue 1-4, 1996, Pages 365-376

  Mertin, W ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; ELECTROOPTICAL DEVICES; FAILURE ANALYSIS; LINEAR INTEGRATED CIRCUITS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SAMPLING;

ANALOG CIRCUITS; CLOCK RATES; ELECTRO OPTIC SAMPLING; SIGNAL INJECTION;

INTEGRATED CIRCUIT TESTING;

EID: 0030083922     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-9317(95)00359-2     Document Type: Article

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