-
1
-
-
0001086646
-
Nondestructive analysis of silicon-on-insulator wafers
-
Bunker S.N., Sioshani L., Sanfacon M.M. et Tobin S.P., Nondestructive analysis of silicon-on-insulator wafers, Appl. Phys. Lett. 50 (1987) 1900-1902.
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 1900-1902
-
-
Bunker, S.N.1
Sioshani, L.2
Sanfacon, M.M.3
Tobin, S.P.4
-
2
-
-
0024108364
-
Analysis of UV-Laser Induced Oxidation of Implanted Silicon by Optical Reflectivity Measurements
-
Foulon F., Slaoui A., Fogarassy E., Fuchs C. et Siffert P., Analysis of UV-Laser Induced Oxidation of Implanted Silicon by Optical Reflectivity Measurements, Appl. Phys. A 47 (1988) 255-258.
-
(1988)
Appl. Phys. A
, vol.47
, pp. 255-258
-
-
Foulon, F.1
Slaoui, A.2
Fogarassy, E.3
Fuchs, C.4
Siffert, P.5
-
3
-
-
0001335005
-
-
Balkanski M., Ed. North-Holland, Amsterdam
-
Cohen M.L. et Chadi D.J., Handbook on semiconductors, Vol. 2, Balkanski M., Ed. (North-Holland, Amsterdam, 1991) pp. 155-179.
-
(1991)
Handbook on Semiconductors
, vol.2
, pp. 155-179
-
-
Cohen, M.L.1
Chadi, D.J.2
-
4
-
-
0542446454
-
-
Willardson R.K. et Beer A.C., Eds. Academic Press, New-York
-
Batz B., Semiconductors and semi-metals, Vol. 9, Willardson R.K. et Beer A.C., Eds. (Academic Press, New-York, 1972) pp. 316-402.
-
(1972)
Semiconductors and Semi-metals
, vol.9
, pp. 316-402
-
-
Batz, B.1
-
5
-
-
0001664218
-
Temperature dependence of the direct gap of Si and Ge
-
Allen P.B. et Cardona M., Temperature dependence of the direct gap of Si and Ge, Phys. Rev. B 27 (1983) 4760-4769.
-
(1983)
Phys. Rev. B
, vol.27
, pp. 4760-4769
-
-
Allen, P.B.1
Cardona, M.2
-
7
-
-
0001635856
-
Photothermal reflectance investigation of processed silicon
-
Chrisofides C., Vitkin I.A. et Mandelis A., Photothermal reflectance investigation of processed silicon, J. Appl. Phys. 67 (1990) 2815-2821.
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 2815-2821
-
-
Chrisofides, C.1
Vitkin, I.A.2
Mandelis, A.3
-
8
-
-
0018441843
-
Temperature dependence of optical properties of silicon
-
Weakliem H.A. et Redfield D., Temperature dependence of optical properties of silicon, J. Appl. Phys. 50 (1979) 1491-1495.
-
(1979)
J. Appl. Phys.
, vol.50
, pp. 1491-1495
-
-
Weakliem, H.A.1
Redfield, D.2
-
9
-
-
0021865966
-
Spectrophotomètre pour la mesure sous vide et à haute température de facteurs de réflexion, Application au silicium monocristallin
-
François J.C., Chassaing G., Argeme L. et Pierrisnard R., Spectrophotomètre pour la mesure sous vide et à haute température de facteurs de réflexion, Application au silicium monocristallin, J. Optics 16 (1985) 47-51.
-
(1985)
J. Optics
, vol.16
, pp. 47-51
-
-
François, J.C.1
Chassaing, G.2
Argeme, L.3
Pierrisnard, R.4
-
10
-
-
33748737754
-
Séparation et étude expérimentale des composantes de l'émission optique d'une couche continue d'argent bombardée par des électrons de 4 à 24 keV
-
Miserey F., Séparation et étude expérimentale des composantes de l'émission optique d'une couche continue d'argent bombardée par des électrons de 4 à 24 keV, Rev. Phys. Appl. 25 (1990) 545-554.
-
(1990)
Rev. Phys. Appl.
, vol.25
, pp. 545-554
-
-
Miserey, F.1
-
13
-
-
33847596250
-
Dielectric functions and optical properties of Si, Ge, GaP, GaAs, GaSb, InP, InAs and InSb from 1.5 to 6 eV
-
Aspnes D.E. et Studna A.A., Dielectric functions and optical properties of Si, Ge, GaP, GaAs, GaSb, InP, InAs and InSb from 1.5 to 6 eV, Phys. Rev. B 27 (1983) 985-1009.
-
(1983)
Phys. Rev. B
, vol.27
, pp. 985-1009
-
-
Aspnes, D.E.1
Studna, A.A.2
-
14
-
-
0001494824
-
Temperature dependence of the optical spectra of Si, Ge, and Ge-Si alloys
-
Humlicek J., Lukes F., Schmidt E, Kekoua M.G. et Khoutsishvili E., Temperature dependence of the optical spectra of Si, Ge, and Ge-Si alloys, Phys. Rev. B 33 (1986) 1092-1100.
-
(1986)
Phys. Rev. B
, vol.33
, pp. 1092-1100
-
-
Humlicek, J.1
Lukes, F.2
Schmidt, E.3
Kekoua, M.G.4
Khoutsishvili, E.5
-
16
-
-
0001257155
-
Electroreflectance and ellipsometry of silicon from 3 to 6 eV
-
Daunois A. et Aspnes D.E., Electroreflectance and ellipsometry of silicon from 3 to 6 eV, Phys. Rev. B 18 (1978) 1824-1839.
-
(1978)
Phys. Rev. B
, vol.18
, pp. 1824-1839
-
-
Daunois, A.1
Aspnes, D.E.2
-
17
-
-
0021405996
-
Pressure coefficients of band gaps in semiconductors
-
Chang K.J., Froyen S. et Cohen M.L., Pressure coefficients of band gaps in semiconductors, Solid State Comm. 50 (1984) 105-107.
-
(1984)
Solid State Comm.
, vol.50
, pp. 105-107
-
-
Chang, K.J.1
Froyen, S.2
Cohen, M.L.3
-
18
-
-
0020833095
-
Refractive index dispersion and related properties in fluorine doped silica
-
Fleming J.W. et Wood D.L., Refractive index dispersion and related properties in fluorine doped silica, Appl. Opt. 22 (1983) 3102-3104.
-
(1983)
Appl. Opt.
, vol.22
, pp. 3102-3104
-
-
Fleming, J.W.1
Wood, D.L.2
-
19
-
-
33748717898
-
Thermal characterization of MOS-Controlled Devices in Transient Conditions: Verification of Thermosensitive Parameters by Experimental and Simulation Tools
-
Farjah E., Schaeffer Ch., Rouve L.L. et Perret R., Thermal characterization of MOS-Controlled Devices in Transient Conditions: Verification of Thermosensitive Parameters by Experimental and Simulation Tools, EPE Journal 4 (1994) 33-37.
-
(1994)
EPE Journal
, vol.4
, pp. 33-37
-
-
Farjah, E.1
Schaeffer, Ch.2
Rouve, L.L.3
Perret, R.4
-
20
-
-
0026108142
-
Liquid crystal imaging for temperature measurements of electronic devices
-
Azar K. et Benson J.R., Liquid crystal imaging for temperature measurements of electronic devices, Proc. of Semi-Therm 8 (1992) 23-33.
-
(1992)
Proc. of Semi-Therm
, vol.8
, pp. 23-33
-
-
Azar, K.1
Benson, J.R.2
-
21
-
-
85033064774
-
Caractérisation électrothermique de composants de puissance: Évaluation et comparaison des approches expérimentales possibles
-
à paraître
-
Armand M., Duveau J., Guérin J., Bliek A. et Tholomier M., Caractérisation électrothermique de composants de puissance : évaluation et comparaison des approches expérimentales possibles, EPE J. (à paraître).
-
EPE J.
-
-
Armand, M.1
Duveau, J.2
Guérin, J.3
Bliek, A.4
Tholomier, M.5
-
22
-
-
0026623717
-
Wavelength-specific pyrometry as a temperature measurement tool
-
Delfino M. et Hodul D.T., Wavelength-specific pyrometry as a temperature measurement tool, IEEE Trans. Electron. Devices 39 (1992) 89-95.
-
(1992)
IEEE Trans. Electron. Devices
, vol.39
, pp. 89-95
-
-
Delfino, M.1
Hodul, D.T.2
-
23
-
-
85033041507
-
1,200 V snubberless symmetrical GTO for ac switches
-
Brighton, U.K., September
-
Kerboua A., Sébille D. et Miserey F., 1,200 V snubberless symmetrical GTO for ac switches, Proc. of 5th EPE Conference, (Brighton, U.K., September 1993).
-
(1993)
Proc. of 5th EPE Conference
-
-
Kerboua, A.1
Sébille, D.2
Miserey, F.3
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