Characterization of contact and via failure under short duration high pulsed current stress

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1997, Pages 216-220

  Banerjee, Kaustav ^a   Amerasekera, Ajith ^a   Dixit, Girish ^a   Cheung, Nathan ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FAILURE ANALYSIS; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL EFFECTS; TITANIUM COMPOUNDS;

SHORT DURATION HIGH PULSED CURRENT STRESS;

OHMIC CONTACTS;

EID: 0030687324     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)