-
1
-
-
0021410769
-
Optical Stethoscopy: Image Recording with Resolution λ/20
-
D. W. Pohl, W. Denk, and M. Lanz, Optical Stethoscopy: Image Recording with Resolution λ/20, Appl. Phys. Lett., vol. 44. pp. 651-653, 1984.
-
(1984)
Appl. Phys. Lett.
, vol.44
, pp. 651-653
-
-
Pohl, D.W.1
Denk, W.2
Lanz, M.3
-
2
-
-
33746232609
-
Near-Field Optical-Scanning Microscopy
-
U. Durig, D. W. Pohl, and F. Rohner, Near-Field Optical-Scanning Microscopy, J. Appl. Phys., vol. 59. pp. 3318-3327, 1986.
-
(1986)
J. Appl. Phys.
, vol.59
, pp. 3318-3327
-
-
Durig, U.1
Pohl, D.W.2
Rohner, F.3
-
3
-
-
12044259475
-
Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale
-
E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weinder, and R. L. Kostelak. Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale. Science, vol. 251. pp. 1468-1470, 1991.
-
(1991)
Science
, vol.251
, pp. 1468-1470
-
-
Betzig, E.1
Trautman, J.K.2
Harris, T.D.3
Weinder, J.S.4
Kostelak, R.L.5
-
4
-
-
3743151120
-
Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification beyond the Diffraction Limit
-
E. Betzig and J. K. Trautman, Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification beyond the Diffraction Limit, Science, vol. 257, pp. 189-195.
-
Science
, vol.257
, pp. 189-195
-
-
Betzig, E.1
Trautman, J.K.2
-
5
-
-
0028493855
-
Scanning Nearfield Optical Micro-scope Using Microfabricated Probes
-
M. Radmacher, P. E. Hillner, and P. K. Hansma, Scanning Nearfield Optical Micro-scope Using Microfabricated Probes, Rev. Sei. Instrum., vol. 65, pp. 2737-2738, 1994.
-
(1994)
Rev. Sei. Instrum.
, vol.65
, pp. 2737-2738
-
-
Radmacher, M.1
Hillner, P.E.2
Hansma, P.K.3
-
6
-
-
0030129489
-
Near-Infrared Contact Mode Collection Near-Field Optical and Normal Force Microscopy of Modulated Multiple Quantum Well Lasers
-
U. Ben-Ami, N. Tessier, N. Ben-Ami, R. Nagar, G. Fish, K. Lieberman, G. Eisenstein, A. Lewis, J. M. Nielsen, and A. Moeller-Larsen, Near-Infrared Contact Mode Collection Near-Field Optical and Normal Force Microscopy of Modulated Multiple Quantum Well Lasers, Appl. Phys. Lett., vol. 68, pp. 2237-2239. 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2237-2239
-
-
Ben-Ami, U.1
Tessier, N.2
Ben-Ami, N.3
Nagar, R.4
Fish, G.5
Lieberman, K.6
Eisenstein, G.7
Lewis, A.8
Nielsen, J.M.9
Moeller-Larsen, A.10
-
7
-
-
36449003280
-
Near-Field Magneto-Optics and High-Density Data Storage
-
E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, and P. L. Finn, Near-Field Magneto-Optics and High-Density Data Storage, Appl. Phys. Lett., vol. 61, pp. 142-144. 1992.
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 142-144
-
-
Betzig, E.1
Trautman, J.K.2
Wolfe, R.3
Gyorgy, E.M.4
Finn, P.L.5
-
8
-
-
0004503252
-
Thermal Phenomena in Semiconductor Devices and Interconnects
-
C. L. Tien. A. Majumdar, and F. Gemer, Taylor & Francis, Washington, DC, in press
-
K. E. Goodson, Y. S. Ju, and M. Asheghi, Thermal Phenomena in Semiconductor Devices and Interconnects, in C. L. Tien. A. Majumdar, and F. Gemer (eds.). Microscale Energy Transport, Taylor & Francis, Washington, DC, in press.
-
Microscale Energy Transport
-
-
Goodson, K.E.1
Ju, Y.S.2
Asheghi, M.3
-
9
-
-
0029356512
-
Prediction and Measurement of Temperature Fields in Silicon-on-Insulator Electronic Circuits
-
K. E. Goodson, M. I. Flik, L. T. Su, and D. A. Antoniadis, Prediction and Measurement of Temperature Fields in Silicon-on-Insulator Electronic Circuits, ASME J. Heal Transfer, vol. 117, pp. 574-581. 1995.
-
(1995)
ASME J. Heal Transfer
, vol.117
, pp. 574-581
-
-
Goodson, K.E.1
Flik, M.I.2
Su, L.T.3
Antoniadis, D.A.4
-
10
-
-
0029700866
-
Characterization of VLSI Circuit Interconnect Heating and Failure under ESD Conditions
-
K. Banerjee, A. Amerasekera, and C. Hu. Characterization of VLSI Circuit Interconnect Heating and Failure under ESD Conditions, Proc. Int. Reliability Physics Symp., pp. 237-245, 1996.
-
(1996)
Proc. Int. Reliability Physics Symp.
, pp. 237-245
-
-
Banerjee, K.1
Amerasekera, A.2
Hu, C.3
-
11
-
-
20544448056
-
Thermal Imaging Using the Atomic Force Microscope
-
A. Majumdar, J. P. Carrejo, and J. Lai, Thermal Imaging Using the Atomic Force Microscope. Appl. Phys. Lett., vol. 62, pp. 2501-2503, 1993.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 2501-2503
-
-
Majumdar, A.1
Carrejo, J.P.2
Lai, J.3
-
12
-
-
21544468949
-
Thermal Imaging by Atomic Force Microscopy Using Thermocouple Cantilever Probes
-
A. Majumdar, J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi, Thermal Imaging by Atomic Force Microscopy Using Thermocouple Cantilever Probes. Rex. Sci. Instrum., vol. 66, pp. 3584-3592, 1995.
-
(1995)
Rex. Sci. Instrum.
, vol.66
, pp. 3584-3592
-
-
Majumdar, A.1
Lai, J.2
Chandrachood, M.3
Nakabeppu, O.4
Wu, Y.5
Shi, Z.6
-
13
-
-
0031139570
-
Transient Thermal Mapping of SOI LDMOS Transistors
-
Y. S. Ju, O. W. Käding, Y. K. Leung, S. S. Wong, and K. E. Goodson, Transient Thermal Mapping of SOI LDMOS Transistors, Electron Device Lett., vol. 18, pp. 169-171, 1997.
-
(1997)
Electron Device Lett.
, vol.18
, pp. 169-171
-
-
Ju, Y.S.1
Käding, O.W.2
Leung, Y.K.3
Wong, S.S.4
Goodson, K.E.5
-
14
-
-
0030646608
-
Short-Timescale Thermometry and Reliability Studies on Interconnects, presented at the International Reliability Physics Symposium, Denver. Colorado, 8-10 April 1997
-
Y. S. Ju and K. E. Goodson, Short-Timescale Thermometry and Reliability Studies on Interconnects, presented at the International Reliability Physics Symposium, Denver. Colorado, 8-10 April 1997, IEEE Catalog No. 97 CH 35983, pp. 320-324.
-
IEEE Catalog No. 97 CH 35983
, pp. 320-324
-
-
Ju, Y.S.1
Goodson, K.E.2
-
15
-
-
36549096343
-
Study of Dynamic Current Distribution in Logic Circuits by Joule Displacement Microscopy
-
Y. Martin and H. K. Wickramasinghe. Study of Dynamic Current Distribution in Logic Circuits by Joule Displacement Microscopy. Appl. Phys. Lett., vol. 50. pp. 167-168. 1987.
-
(1987)
Appl. Phys. Lett
, vol.50
, pp. 167-168
-
-
Martin, Y.1
Wickramasinghe, H.K.2
-
16
-
-
0027629313
-
Thermoreflectance Optical Test Probe for the Measurement of Current-Induced Temperature Changes in Microelectronic Components
-
W. Claeys, S. Dilhaire, V. Quintard, J. P. Dorn, and Y. Danto. Thermoreflectance Optical Test Probe for the Measurement of Current-Induced Temperature Changes in Microelectronic Components. Reliability Eng. Int., vol. 9, pp. 303-308, 1993.
-
(1993)
Reliability Eng. Int.
, vol.9
, pp. 303-308
-
-
Claeys, W.1
Dilhaire, S.2
Quintard, V.3
Dorn, J.P.4
Danto, Y.5
-
17
-
-
0039343959
-
Raman Spectroscopy for Characterization of Lazered Semiconductor Materials and Devices
-
K. J. Lockwood and J. F. Young, Plenum Press, New York
-
H. Brugger, Raman Spectroscopy for Characterization of Lazered Semiconductor Materials and Devices, in K. J. Lockwood and J. F. Young (eds.), Light Scattering in Semiconductor Structures and Superlattices, pp. 259-274. Plenum Press, New York.
-
Light Scattering in Semiconductor Structures and Superlattices
, pp. 259-274
-
-
Brugger, H.1
-
18
-
-
0026852626
-
Temperature Distribution in Si-MOSFET's Studied by Micro Raman Spectroscopy
-
R. Ostermeier, K. Brunner, G. Abstreiter, and W. Weber. Temperature Distribution in Si-MOSFET's Studied by Micro Raman Spectroscopy. IEEE Trans. Electron Devices, vol. 39, pp. 858-863, 1992.
-
(1992)
IEEE Trans. Electron Devices
, vol.39
, pp. 858-863
-
-
Ostermeier, R.1
Brunner, K.2
Abstreiter, G.3
Weber, W.4
-
19
-
-
0025497762
-
Surface Plasmon Enhanced Transient Thermoreflectance
-
S. Herminghaus and P. Leiderer, Surface Plasmon Enhanced Transient Thermoreflectance, Appl. Phys., vol. A51, pp. 350-353. 1990.
-
(1990)
Appl. Phys.
, vol.A51
, pp. 350-353
-
-
Herminghaus, S.1
Leiderer, P.2
-
20
-
-
0029638092
-
On the Heating of the Fiber Tip in a Near-Field Scanning Optical Microscope
-
D. I. Kavaidjiev, R. Toledo-Cros, and M. Vaez-lravani, On the Heating of the Fiber Tip in a Near-Field Scanning Optical Microscope, Appl. Phys. Lett., vol. 67. pp. 2771-2774. 1995.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 2771-2774
-
-
Kavaidjiev, D.I.1
Toledo-Cros, R.2
Vaez-Lravani, M.3
-
21
-
-
0029550971
-
Thermal/Optical Effects in NSOM Probes
-
B. I. Yakobson, A. LaRosa, H. D. Hallen, and M. A. Paesler. Thermal/Optical Effects in NSOM Probes, Ultramicroscopy, vol. 61, pp. 179-185, 1995.
-
(1995)
Ultramicroscopy
, vol.61
, pp. 179-185
-
-
Yakobson, B.I.1
Larosa, A.2
Hallen, H.D.3
Paesler, M.A.4
-
22
-
-
0029239778
-
Near-Field, Far-Field and Imaging Properties of the 2D Aperture SNOM
-
L. Novotny, D. W. Pohl, and P. Regli, Near-Field, Far-Field and Imaging Properties of the 2D Aperture SNOM. Ultramicroscopy, vol. 57, pp. 180-188, 1995.
-
(1995)
Ultramicroscopy
, vol.57
, pp. 180-188
-
-
Novotny, L.1
Pohl, D.W.2
Regli, P.3
-
23
-
-
0029346867
-
Electromagnetic Fields in Two-Dimensional Models of Near-Field Optical Microscope Tips
-
A. Castiaux, A. Dereux, J.-P. Vigneron, C. Girard, and O. J. F. Martin. Electromagnetic Fields in Two-Dimensional Models of Near-Field Optical Microscope Tips, Ultramicroscopy, vol. 60, pp. 1-9, 1995.
-
(1995)
Ultramicroscopy
, vol.60
, pp. 1-9
-
-
Castiaux, A.1
Dereux, A.2
Vigneron, J.-P.3
Girard, C.4
Martin, O.J.F.5
|