메뉴 건너뛰기




Volumn 1, Issue 3, 1997, Pages 201-213

Experimental study on point contact transport phenomena using the atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031475673     PISSN: 10893954     EISSN: None     Source Type: Journal    
DOI: 10.1080/108939597200223     Document Type: Article
Times cited : (18)

References (14)
  • 2
    • 0007994272 scopus 로고    scopus 로고
    • Scanning probe microscopy of thermal conductivity and subsurface properties
    • M. Nonnenmacher and H. K. Wickramasinghe, Scanning Probe Microscopy of Thermal Conductivity and Subsurface Properties, Appl. Phys. Lett., vol. 61, pp. 168-170.
    • Appl. Phys. Lett. , vol.61 , pp. 168-170
    • Nonnenmacher, M.1    Wickramasinghe, H.K.2
  • 3
    • 20544448056 scopus 로고
    • Thermal imaging using the atomic force microscope
    • A. Majumdar, J. P. Carrejo, and J. Lai, Thermal Imaging Using the Atomic Force Microscope, Appl. Phys. Lett., vol. 62, pp. 2501-2503, 1993.
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 2501-2503
    • Majumdar, A.1    Carrejo, J.P.2    Lai, J.3
  • 4
    • 21544468949 scopus 로고
    • Thermal imaging by atomic force microscopy using thermocouple cantilever probes
    • A. Majumdar, J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi, Thermal Imaging by Atomic Force Microscopy Using Thermocouple Cantilever Probes, Rev. Sci. Instrum., vol. 66, no. 6, pp. 3584-3592, 1995.
    • (1995) Rev. Sci. Instrum. , vol.66 , Issue.6 , pp. 3584-3592
    • Majumdar, A.1    Lai, J.2    Chandrachood, M.3    Nakabeppu, O.4    Wu, Y.5    Shi, Z.6
  • 5
    • 0028443485 scopus 로고
    • Scanning near-field optical microscopy and scanning thermal microscopy
    • R. J. Pylkki, P. J. Moyer, and P. E. West, Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy, Jpn. J. Appl. Phys., vol. 33, pp. 3785-3790, 1994.
    • (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 3785-3790
    • Pylkki, R.J.1    Moyer, P.J.2    West, P.E.3
  • 6
    • 36449004953 scopus 로고
    • Scanning thermal imaging microscopy using composite cantilever probes
    • O. Nakabeppu, M. Chandrachood, Y. Wu, J. Lai, and A. Majumdar, Scanning Thermal Imaging Microscopy Using Composite Cantilever Probes, Appl. Phys. Lett., vol. 66, pp. 694-696, 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 694-696
    • Nakabeppu, O.1    Chandrachood, M.2    Wu, Y.3    Lai, J.4    Majumdar, A.5
  • 8
    • 0028517868 scopus 로고
    • Review of elastic and plastic contact conductance models: Comparison with experiment
    • M. R. Sridhar and M. M. Yovanovich, Review of Elastic and Plastic Contact Conductance Models: Comparison with Experiment, J. Thermophys. Heat Transfer, vol. 8, pp. 633-640, 1994.
    • (1994) J. Thermophys. Heat Transfer , vol.8 , pp. 633-640
    • Sridhar, M.R.1    Yovanovich, M.M.2
  • 11
    • 0029408366 scopus 로고
    • Thermoelectric voltage at metallic point contacts from nonequilibrium effects
    • K. Ito, K. Hijikata, K. Torikoshi, and P. E. Phelan, Thermoelectric Voltage at Metallic Point Contacts from Nonequilibrium Effects, Trans. ASME J. Heat Transfer, vol. 117, pp. 822-827, 1995.
    • (1995) Trans. ASME J. Heat Transfer , vol.117 , pp. 822-827
    • Ito, K.1    Hijikata, K.2    Torikoshi, K.3    Phelan, P.E.4
  • 13
    • 4544253610 scopus 로고    scopus 로고
    • Atomic-sized metallic contacts: Mechanical properties and electronic transport
    • G. Rubio, N. Agrait, and S. Vieira, Atomic-Sized Metallic Contacts: Mechanical Properties and Electronic Transport, Phys. Rev. Lett., vol. 76, pp. 2302-2305, 1996.
    • (1996) Phys. Rev. Lett. , vol.76 , pp. 2302-2305
    • Rubio, G.1    Agrait, N.2    Vieira, S.3
  • 14
    • 85040875608 scopus 로고
    • Cambridge University Press, Cambridge, UK
    • K. L. Johnson, Contact Mechanics, Cambridge University Press, Cambridge, UK, 1985.
    • (1985) Contact Mechanics
    • Johnson, K.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.