Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 7, 2012, Pages

  Sadeghi, Ali ^a   Baratoff, Alexis ^a   Ghasemi, S Alireza ^a   Goedecker, Stefan ^a   Glatzel, Thilo ^a   Kawai, Shigeki ^a   Meyer, Ernst ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84865072860     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.075407     Document Type: Article

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