Cantilever effects on electrostatic force gradient microscopy

Applied Physics Letters

Volumn 85, Issue 13, 2004, Pages 2610-2612

  Sacha, G M ^a   Saenz J J ^a  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BOUNDARY CONDITIONS; CAPACITANCE; CAPACITORS; DIELECTRIC FILMS; ELECTRIC FIELDS; ELECTRODES; ELECTROSTATICS; GREEN'S FUNCTION; LEAST SQUARES APPROXIMATIONS;

ELECTROSTATIC FORCE MICROSCOPY (EFM); ELECTROSTATIC POTENTIAL DISTRIBUTION; GENERALIZED IMAGE-CHARGE METHOD (GICM); SCANNING FORCE MICROSCOPY (SFM);

CANTILEVER BEAMS;

EID: 7544221267     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1797539     Document Type: Article

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