Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions

Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 16, 2012, Pages

  Baier, Robert ^a   Leendertz, Caspar ^a   Lux Steiner, Martha Ch ^a   Sadewasser, Sascha ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b INTERNATIONAL IBERIAN NANOTECHNOLOGY LABORATORY   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84860243430     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.165436     Document Type: Article

References (41)

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38. Simulation parameters: tip height 13 μ m, sample radius 25 μ m, θ = 30 , r = 10 nm, SCR 65 nm.
39. An inaccuracy of 4 meV was assumed for the experimental data based on the noise level, and for the simulation data the inaccuracy was estimated as 2 % based on Fig.
40. Simulation parameters: tip height 13 μ m, sample radius 25 μ m, θ = 10 , r = 30 nm, SCR 65 nm.
41. Simulation parameters: tip height 13 μ m, sample radius 25 μ m, θ = 30 , r various, SCR 65 nm.