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Applied Physics Letters

Volumn 97, Issue 4, 2010, Pages

Accurate formula for conversion of tunneling current in dynamic atomic force spectroscopy

(2) Sader, John E a Sugimoto, Yoshiaki b

a UNIVERSITY OF MELBOURNE (Australia)

b OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE FORMULAS; ANALYTICAL FORMULAS; ATOMIC FORCE SPECTROSCOPY; CURRENT LAW; DYNAMIC ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; FREQUENCY SHIFT; INTERACTION FORCES; OSCILLATION AMPLITUDE; SIMULTANEOUS MEASUREMENT; THEORETICAL FRAMEWORK; TIME-AVERAGED; TUNNELING CURRENT;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIELECTRIC PROPERTIES; ELECTRON TUNNELING; FREQUENCY MODULATION; IDENTIFICATION (CONTROL SYSTEMS);

ATOMS;

EID: 77955740586 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3464165 Document Type: Article

Times cited : (19)

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