Simulation method of Kelvin probe force microscopy at nanometer range and its application

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 19, 2010, Pages

  Masago, A ^a   Tsukada, M ^a   Shimizu, M ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b Research Laboratory   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78649737483     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.195433     Document Type: Article

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