Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy

Nanotechnology

Volumn 21, Issue 24, 2010, Pages

  Kawai, Shigeki ^a,b   Glatzel, Thilo ^b   Hug, Hans Josef ^a   Meyer, Ernst ^b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC CONTACTS; CONTACT POTENTIAL DIFFERENCE; COVALENT BONDING; ENHANCED SENSITIVITY; KELVIN PROBE FORCE MICROSCOPY; MECHANICAL QUALITY FACTORS; NUMERICAL CALCULATION; SHORT RANGE INTERACTIONS; SI (1 1 1); SILICON CANTILEVER; THEORETICAL CALCULATIONS; TIP-SAMPLE DISTANCE;

AMPLITUDE MODULATION; PROBES;

FREQUENCY MODULATION;

EID: 77952632998     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/24/245704     Document Type: Article

References (57)

1. Abraham D, Williams C, Slinkman J and Wickramasinghe H 1991 J. Vac. Sci. Technol. B 9 703
2. Albrecht T R, Grütter P, Horne D and Rugar D 1991 J. Appl. Phys. 69 668
3. Shiota T and Nakayama K 2001 Japan. J. Appl. Phys. 40 L986
4. Sadewasser S and Lux-Steiner M C 2003 Phys. Rev. Lett. 91 266101
5. Hoppe H, Glatzel T, Niggemann M, Hinsch A, Lux-Steiner M C and Sariciftci N S 2004 Nano Lett. 5 269
6. Glatzel T, Marrón D F, Schedel-Niedrig T, Sadewasser S and Lux-Steiner M C 2002 Appl. Phys. Lett. 81 2017
7. Loppacher C, Zerweck U, Teich S, Beyreuther E, Otto T, Grafström S and Eng L 2005 Nanotechnology 16 S1
8. Glatzel T, Hoppe H, Sariciftci N, Lux-Steiner M and Komiyama M 2005 Japan. J. Appl. Phys. 44 5370
9. Hiehata K, Sasahara A and Onishi H 2007 Nanotechnology 18 084007
10. Yamauchi T, Tabuchi M and Nakamura A 2004 Appl. Phys. Lett. 84 3834
11. Rosenwaks Y, Shikler R, Glatzel T and Sadewasser S 2004 Phys. Rev. B 70 085320
12. Sommerhalter C, Matthes T W, Glatzel T, Jäger-Waldau A and Lux-Steiner M C 1999 Appl. Phys. Lett. 75 286
13. Kitamura S, Suzuki K and Iwatsuki M 1999 Appl. Surf. Sci. 140 265
14. Barth C and Henry C R 2007 Phys. Rev. Lett. 98 136804
15. Kitamura S, Suzuki K, Iwatsuki M and Mooney C B 2000 Appl. Surf. Sci. 157 222
16. Shiota T and Nakayama K 2002 Appl. Surf. Sci. 202 218
17. Okamoto K, Yoshimoto K, Sugawara Y and Morita S 2003 Appl. Surf. Sci. 210 128
18. Eguchi T, et al. 2004 Phys. Rev. Lett. 93 266102
19. Enevoldsen G H, Glatzel T, Christensen M C, Lauritsen J V and Besenbacher F 2008 Phys. Rev. Lett. 100 236104
20. Krok F, Sajewicz K, Konior J, Goryl M, Piatkowski P and Szymonski M 2008 Phys. Rev. B 77 235427
21. Bocquet F, Nony L, Loppacher C and Glatzel T 2008 Phys. Rev. B 78 035410
22. Glatzel T, Zimmerli L, Koch S, Kawai S and Meyer E 2009 Appl. Phys. Lett. 94 063303
23. Sadewasser S, Jelinek P, Fang C-K, Custance O, Yamada Y, Sugimoto Y, Abe M and Morita S 2009 Phys. Rev. Lett. 103 266103
24. Jean M S, Hudlet S, Guthmann C and Berger J 1997 Phys. Rev. B 56 15391
25. Gross L, Mohn F, Liljeroth P, Repp J, Giessibl F J and Meye G 2009 Science 324 1428
26. Kitamura S and Iwatsuki M 1998 Appl. Phys. Lett. 72 3154
27. Leng Y, Willams C C, Su L C and Stringfellow G B 1995 Appl. Phys. Lett. 66 1264
28. Glatzel T, Zimmerli L and Meyer E 2008 Isr. J. Chem. 48 107
29. Giessibl F J 2003 Rev. Mod. Phys. 75 949
30. Kawai S, Kitamura S, Kobayashi D and Kawakatsu H 2005 Appl. Phys. Lett. 87 173105
31. Hoogenboom B W, et al. 2005 Appl. Phys. Lett. 86 074101
32. Fukuma T, Kimura K, Kobayashim K, Matsushige K and Yamada H 2005 Rev. Sci. Instrum. 76 126110
33. Kawai S, Kobayashi D, Kitamura S, Meguro S and Kawakatsu H 2005 Rev. Sci. Instrum. 76 083703
34. Kawai S and Kawakatsu H 2006 Appl. Phys. Lett. 88 133103
35. Kawai S and Kawakatsu H 2009 Phys. Rev. B 79 115440
36. Kawai S, Glatzel T, Koch S, Such B, Baratoff A and Meyer E 2009 Phys. Rev. B 80 085422
37. Glatzel T, Sadewasser S and Lux-Steiner M C 2003 Appl. Surf. Sci. 210 84
38. Zerweck U, Loppacher C, Otto T, Grafström S and Eng L 2005 Phys. Rev. B 71 125424
39. Howald L, Meyer E, Lüthi R, Haefke H, Overney R, Rudin H and Güntherodt H J 1993 Appl. Phys. Lett. 63 117
40. Kawai S and Kawakatsu H 2006 Appl. Phys. Lett. 89 013108
41. Kawai S, Glatzel T, Koch S, Such B, Baratoff A and Meyer E 2009 Phys. Rev. Lett. 103 220801
42. Horcas I, Fernandez R, Gomez-Rodriguez J, Colchero J, Gomez-Herrero J and Baro A 2007 Rev. Sci. Instrum. 78 013705
43. Okamoto K, Sugawara Y and Morita S 2002 Appl. Surf. Sci. 188 381
44. Barth C, Pakarinen O, Foster A and Henry C 2006 Nanotechnology 17 S128
45. Giessibl F J 1997 Phys. Rev. B 56 16010
46. Nony L, Bocquet F, Loppacher C and Glatzel T 2009 Nanotechnology 20 264014
47. Oyabu N, Pou P, Sugimoto Y, Jelinek P, Abe M, Morita S, Pérez R and Custance O 2006 Phys. Rev. Lett. 96 106101
48. Olsson L, Lin N, Yakimov V and Erlandsson R 1998 J. Appl. Phys. 84 4060
49. Hudlet S, Jean M S, Guthmann C and Berger J 1998 Eur. Phys. J. B 2 5
50. Guggisberg M, Bammerlin M, Loppacher C, Pfeiffer O, Abdurixit A, Barwich V, Bennewitz R, Baratoff A, Meyer E and Güntherodt H J 2000 Phys. Rev. B 61 11151
51. Kawai S, Glatzel T, Koch S, Such B, Baratoff A and Meyer E 2010 Phys. Rev. B 81 085420
52. Giessibl F J 1998 Appl. Phys. Lett. 73 3956
53. Sasaki N and Tsukada M 1998 Japan. J. Appl. Phys. 37 L533
54. Robins W 1982 Phase Noise in Signal Sources (Theory and Applications) (IEE Telecommunications Series vol 9) (London: Peter Peregrinus, Ltd)
55. Saulson P R 1990 Phys. Rev. D 42 2437
56. Giessibl F, Bielefeldt H, Hembacher S and Mannhart J 2001 Ann. Phys. 10 887
57. Sasaki N and Tsukada M 1999 Japan. J. Appl. Phys. 38 192