Real versus measured surface potentials in scanning Kelvin probe microscopy

ACS Nano

Volumn 2, Issue 4, 2008, Pages 622-626

  Charrier, Dimitri S H ^a   Kemerink, Martijn ^a   Smalbrugge, Barry E ^a   de Vries, Tjibbe ^a   Janssen, René A J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Capacitive coupling; Electrical characterization; Numerical modeling; Organic transistors; Scanning Kelvin probe microscopy

Indexed keywords

SCANNING; SURFACE POTENTIAL;

(1 1 0) SURFACE; (1 1 1) ORIENTATION; AMERICAN CHEMICAL SOCIETY (ACS); DEVICE MODELLING; NONCONTACT (NC); NONLOCAL COUPLING; ORGANIC DEVICES; POTEN TIAL PROFILE; POTENTIOMETRY; SCANNING KELVIN PROBE MICROSCOPY (SKPM); TIP SAMPLE DISTANCE;

CHARGE INJECTION;

NANOMATERIAL;

ARTICLE; ARTIFACT; CHEMISTRY; COMPARATIVE STUDY; CONFORMATION; ELECTROMAGNETIC FIELD; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

ARTIFACTS; ELECTROMAGNETIC FIELDS; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 46849118052     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn700190t     Document Type: Article

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