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Volumn 108, Issue 8, 2008, Pages 773-781
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Kelvin force microscopy at the second cantilever resonance: An out-of-vacuum crosstalk compensation setup
a
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Author keywords
Atomic force microscopy (AFM)
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Indexed keywords
CONTROL THEORY;
CROSSTALK;
ELECTRIC POTENTIAL;
ELECTROSTATICS;
ENGINEERING GEOLOGY;
GALLIUM ALLOYS;
MICROSCOPES;
NANOSTRUCTURED MATERIALS;
NATURAL FREQUENCIES;
RADIO;
REMOTE CONTROL;
SEPARATION;
SHIP STEERING EQUIPMENT;
TOPOGRAPHY;
TRANSFER FUNCTIONS;
VACUUM;
VOLTAGE REGULATORS;
APPLIED (CO);
CANTILEVER DEFLECTION;
CANTILEVER RESONANCE;
CAPACITIVE CROSSTALK;
CLOSED FEEDBACK LOOP;
CLOSED-LOOP TRANSFER FUNCTIONS;
CONSTANT FREQUENCY;
DC COMPONENTS;
DEFLECTION (OVALIZATION);
ELECTROSTATIC EXCITATION;
ELSEVIER (CO);
FREQUENCY CONTROL LOOP;
GAP VOLTAGES;
KELVIN FORCE MICROSCOPY (KFM);
NONCONTACT (NC);
OSCILLATION AMPLITUDES;
OUTPUT SIGNALS;
RESONANCE FREQUENCIES;
SELF EXCITATION;
TIP BIAS;
VACUUM ENVIRONMENT;
VOLTAGE CONTROL LOOP;
RESONANCE;
AMPLITUDE MODULATION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
EXCITATION;
EXPERIMENTATION;
FEEDBACK SYSTEM;
FREQUENCY ANALYSIS;
IMAGE ANALYSIS;
KELVIN FORCE MICROSCOPY;
OSCILLATION;
SIGNAL PROCESSING;
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EID: 45449111188
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2008.01.003 Document Type: Article |
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Times cited : (26)
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References (13)
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