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Volumn 79, Issue 24, 2001, Pages 4048-4050

Electrostatic forces between sharp tips and metallic and dielectric samples

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EID: 0035842818     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1424478     Document Type: Article
Times cited : (82)

References (33)
  • 33
    • 22244437870 scopus 로고    scopus 로고
    • Notice that this holds only for the forces on the tip. In EFM, for large tip-sample distances the forces on the cantilever may become dominant see Ref. 14 and unpublished
    • Notice that this holds only for the forces on the tip. In EFM, for large tip-sample distances the forces on the cantilever may become dominant [see Ref. 14 and J. Colchero et al. (unpublished)].
    • Colchero, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.