Electrostatic forces between sharp tips and metallic and dielectric samples

Applied Physics Letters

Volumn 79, Issue 24, 2001, Pages 4048-4050

  Gomez Monivas S ^a   Froufe Perez L S ^a   Caamano A J ^a   Saenz J J ^a  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035842818     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1424478     Document Type: Article

References (33)

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33. Notice that this holds only for the forces on the tip. In EFM, for large tip-sample distances the forces on the cantilever may become dominant [see Ref. 14 and J. Colchero et al. (unpublished)].