Resolution of Kelvin probe force microscopy in ultrahigh vacuum: Comparison of experiment and simulation

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 32-36

  Sadewasser, S ^a   Glatzel, Th ^a   Shikler, R ^b   Rosenwaks, Y ^b   Lux Steiner, M Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

AFM; Electrostatic force; KPFM; Work function

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR MATERIALS;

KELVIN PROBE FORCE MICROSCOPY (KPFM);

ULTRAHIGH VACUUM;

EID: 0037474565     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01475-7     Document Type: Conference Paper

References (15)

1. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications, Cambridge University Press, Cambridge, 1994.
2. Weaver J.M.R., Abraham D.W. J. Vac. Sci. Technol. B. 9:1991;1559.
3. Nonnenmacher M., O'Boyle M.P., Wickramasinghe H.K. Appl. Phys. Lett. 58:1991;2921.
4. Kikukawa A., Hosaka S., Imura R. Appl. Phys. Lett. 66:1995;3510.
5. Kitamura S., Suzuki K., Iwatsuki M. Appl. Surf. Sci. 140:1999;265.
6. Kitamura S., Suzuki K., Iwatsuki M., Mooney C.B. Appl. Surf. Sci. 157:2000;222.
7. Henning A.K., Hochwitz T., Slinkman J., Never J., Hoffmann S., Kaszuba P., Daghlian C. J. Appl. Phys. 77:1995;1888.
8. Kikukawa A., Hosaka S., Imura R. Rev. Sci. Instrum. 67:1996;1463.
9. Belaidi S., Lebon F., Girard P., Leveque G., Pagano S. Appl. Phys. A. 66:1998;S239.
10. Jacobs H.O., Leuchtmann P., Homan O.J., Stemmer A. J. Appl. Phys. 84:1998;1168.
11. Koley G., Spencer M.G., Bhangale H.R. Appl. Phys. Lett. 79:2001;545.
12. Hochwitz T., Henning A.K., Levey C., Daghlian C., Slinkman J. J. Vac. Sci. Technol. B. 14:1996;457.
13. Sommerhalter Ch., Matthes Th.W., Glatzel Th., Jäger-Waldau A., Lux-Steiner M.Ch. Appl. Phys. Lett. 75:1999;286.
14. Sommerhalter Ch., Glatzel Th., Matthes Th.W., Jäger-Waldau A., Lux-Steiner M.Ch. Appl. Surf. Sci. 157:2000;263.
15. Th. Glatzel, S. Sadewasser, R. Shikler, Y. Rosenwaks, M.Ch. Lux-Steiner, Mater. Sci. Eng. B, in print (2003).