Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations

Review of Scientific Instruments

Volumn 79, Issue 2, 2008, Pages

  Shen, Yongxing ^a   Barnett, David M ^a   Pinsky, Peter M ^a  

^a Stanford University

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; BOUNDARY INTEGRAL EQUATIONS; DECONVOLUTION; ELECTRON TRAPS; FEEDBACK CONTROL; GADOLINIUM COMPOUNDS; INVERSE PROBLEMS; SCANNING PROBE MICROSCOPY; THIN FILMS;

DECONVOLUTION ALGORITHMS; FORWARD PROBLEM SOLUTION; KELVIN PROBE FORCE MICROSCOPY;

COULOMB INTERACTIONS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMPEDANCE; MATERIALS TESTING; METHODOLOGY; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; MODELS, THEORETICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 40149090648     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2885679     Document Type: Article

References (13)

1. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.105227 58, 2921 (1991).
2. C. Loppacher, U. Zerweck, and L. M. Eng, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/15/2/003 15, S9 (2004).
3. Y. Rosenwaks, R. Shikler, Th. Glatzel, and S. Sadewasser, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.085320 70, 085320 (2004).
4. H. Hoppe, T. Glatze, M. Niggemann, A. Hinsch, M. Ch. Lux-Steiner, and N. S. Sariciftci, Nano Lett. NALEFD 1530-6984 10.1021/nl048176c 5, 269 (2005).
5. V. Palermo, M. Palma, Ž. Tomović, M. D. Watson, R. Friedlein, K. Müllen, and P. Samori, ChemPhysChem CPCHFT 1439-4235 10.1002/cphc.200500181 6, 2371 (2005).
6. H. O. Jacobs, P. Leuchtmann, O. J. Homan, and A. Stemmer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.368181 84, 1168 (1998).
7. E. Strassburg, A. Boag, and Y. Rosenwaks, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1988089 76, 083705 (2005).
8. M. Lee, W. Lee, and F. B. Prinz, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/17/15/019 17, 3728 (2006).
9. J. D. Jackson, Classical Electrodynamics (Wiley, New York, 1998).
10. M. Lee, Ph.D. thesis, Stanford University, 2008.
11. A. K. Jain, Fundamentals of Digital Image Processing (Prentice-Hall, Englewood Cliffs, NJ, 1989).
12. G. Beer, Programming the Boundary Element Method: An Introduction for Engineers (Wiley, Chichester, 2001).
13. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in FORTRAN: The Art of Scientific Computing (Cambridge, New York, 1992).