Vacuum compatible high-sensitive Kelvin probe force microscopy

Review of Scientific Instruments

Volumn 67, Issue 4, 1996, Pages 1463-1467

  Kikukawa, Atsushi ^a   Hosaka, Sumio ^a   Imura, Ryo ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000267538     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146874     Document Type: Article

References (11)

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