AFM tip characterization by Kelvin probe force microscopy

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Barth, C ^a   Hynninen, T ^c,d   Bieletzki, M ^b   Henry, C R ^a   Foster, A S ^c,d   Esch, F ^b   Heiz, U ^b  

^a CNRS   (France)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^d AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

AFM MANIPULATION; AFM TIP; ATOMIC FORCE MICROSCOPES; CHARGE CONTROL; COMPLEX INTERFACE; ELECTROSTATIC SIGNATURES; ELECTROSTATIC SURFACES; KELVIN PROBE FORCE MICROSCOPY; MOLECULAR SYSTEMS; NANOSTRUCTURED SURFACE; QUANTITATIVE MEASUREMENT; SINGLE ION; SPATIAL RESOLUTION; SURFACE WORK FUNCTIONS; THEORETICAL MODELING; TIP APEX;

ATOMIC FORCE MICROSCOPY; BIOLOGICAL MEMBRANES; CYTOLOGY; ELECTROSTATICS; SURFACE POTENTIAL; SURFACE PROPERTIES;

PROBES;

EID: 77958538480     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/9/093024     Document Type: Article

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