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Volumn 81, Issue 24, 2010, Pages

Simultaneous AFM and STM measurements on the Si(111 ) - (7×7 ) surface

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Indexed keywords


EID: 77954330695     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.245322     Document Type: Article
Times cited : (50)

References (53)
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    • Precisely, van der Waals force and electrostatic force should be treated independently by measuring Δf- Vs at every z point (Ref.). Therefore, this fitting method may produce some errors in FSR values. We will discuss this issue elsewhere
    • Precisely, van der Waals force and electrostatic force should be treated independently by measuring Δ f - V s at every z point (Ref.). Therefore, this fitting method may produce some errors in F S R values. We will discuss this issue elsewhere.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.