Fullerene adsorption on semiconductor surfaces

Surface Science Reports

Volumn 65, Issue 7, 2010, Pages 175-227

  Moriarty, Philip J ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Adsorption; Chemisorption; Electronic structure; Fullerene; Molecular manipulation; Photoemission; Scanning probe microscopy; Scanning tunnelling microscopy; Semiconductor; Single molecule spectroscopy; Surface science; X ray absorption

Indexed keywords

ADSORPTION; CHEMISORPTION; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; GALLIUM ARSENIDE; GERMANIUM COMPOUNDS; HYDROPHOBICITY; III-V SEMICONDUCTORS; INDIUM PHOSPHIDE; MOLECULES; PHOTOEMISSION; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR MATERIALS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY;

COMPOUND SEMICONDUCTORS; FULLERENE MOLECULES; HIGHER FULLERENES; MOLECULAR MANIPULATION; SEMI-CONDUCTOR SURFACES; SEMICONDUCTOR INTERFACES; SINGLE MOLECULE SPECTROSCOPY; SURFACE SCIENCE;

FULLERENES;

EID: 77957140704     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2010.08.001     Document Type: Review

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