Probing the interaction at the C60-SiC nanomesh interface

Surface Science

Volumn 601, Issue 14, 2007, Pages 2994-3002

  Chen, Wei ^a   Chen, Shi ^a   Zhang, Hong Liang ^a   Xu, Hai ^a   Qi, Dong Chen ^a   Gao, Xing Yu ^a   Loh, Kian Ping ^a   Wee, Andrew Thye Shen ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Interface; Nanotemplate; Photoemission spectroscopy; Scanning tunneling microscopy; Self assembly; Synchrotron radiation

Indexed keywords

NANOMESH INTERFACES; NANOTEMPLATES; SUBMONOLAYER CONDITION;

CHARGE TRANSFER; FULLERENES; NANOSTRUCTURED MATERIALS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SILICON CARBIDE; SYNCHROTRON RADIATION;

INTERFACES (MATERIALS);

EID: 34447282792     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.009     Document Type: Article

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