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Journal of Vacuum Science and Technology B

Volumn 28, Issue 3, 2010, Pages

Investigation of interface between fullerene molecule and Si (111)-7×7 surface by noncontact scanning nonlinear dielectric microscopy

(2) Kobayashi, Shin Ichiro a Cho, Yasuo a

a TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; DANGLING BONDS; DIPOLE MOMENT; ELECTRIC DIPOLE MOMENTS; FULLERENES;

C 60; ELECTRIC-DIPOLE MOMENT; FULLERENE (C 60); FULLERENE MOLECULES; MOLECULAR SCALE; NON-CONTACT; SCANNING NONLINEAR DIELECTRIC MICROSCOPY; SI(1 1 1)-7 × 7; SI(111)7×7; ULTRAHIGH VACUUM CONDITIONS;

MOLECULES;

EID: 77952989587 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3373959 Document Type: Conference Paper

Times cited : (9)

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