Adsorption of C60 on Si(111)√3 × √3R(30°)-Ag

Surface Science

Volumn 377-379, Issue , 1997, Pages 1061-1065

  Le Lay, G ^a,b   Gothelid M ^a   Aristov, V Yu ^a   Cricenti, A ^c   Hakansson M C ^c   Giammichele, C ^c   Perfetti, P ^c   Avila, J ^d   Asensio, M C ^d  

^a CNRS   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

^c CNR   (Italy)

^d UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Auger electron spectroscopy; Fullerene thin films; Fullerenes; Silicon; Silver; Surface relaxation and reconstruction; Synchrotron radiation spectroscopy

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; MONOLAYERS; SILICON; SILVER; SURFACE PHENOMENA; SYNCHROTRON RADIATION; THERMAL EFFECTS; THERMODYNAMIC STABILITY; THIN FILMS;

HIGH RESOLUTION SYNCHROTRON RADIATION CORE LEVEL SPECTROSCOPY; SURFACE RECONSTRUCTION; SURFACE RELAXATION;

FULLERENES;

EID: 0031123572     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0039-6028(96)81564-0     Document Type: Article

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