Lateral forces during manipulation of a single C60 molecule on the Si(0 0 1)-2 × 1 surface

Surface Science

Volumn 517, Issue 1-3, 2002, Pages

  Kageshima, Masami ^a   Ogiso, Hisato ^a   Tokumoto, Hiroshi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscopy; Friction; Fullerenes; Scanning tunneling microscopy; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; FULLERENES; PROBES; SCANNING TUNNELING MICROSCOPY; SENSORS; SILICON;

LATERAL FORCE SENSORS;

SURFACE PHENOMENA;

EID: 0036783512     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02059-9     Document Type: Article

References (23)