Electronic transport at semiconductor surfaces - From point-contact transistor to micro-four-point probes

Surface Science

Volumn 500, Issue 1-3, 2002, Pages 84-104

  Hasegawa, Shuji ^a,b   Grey, François ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Electrical transport measurements; Scanning tunneling microscopy; Silicon; Silver; Surface electrical transport (surface conductivity, surface recombination, etc.); Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LEVELS; ELECTRON TRANSPORT PROPERTIES; FIELD EFFECT TRANSISTORS; MICROELECTRONICS; POINT CONTACTS; SCANNING ELECTRON MICROSCOPY;

SEMICONDUCTOR SURFACES;

SURFACE PROPERTIES;

EID: 0037051013     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01533-3     Document Type: Article

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