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Materials Science and Engineering: B
Volumn 89, Issue 1-3, 2002, Pages 394-398
STM studies of C60 on a Si(1 1 1): B surface phase
(4)
Stimpel, T
a
Schraufstetter, M
a
Baumgartner H
a
Eisele, I
a
a
BUNDESWEHR UNIVERSITY MUNICH
(
Germany
)
Author keywords
Boron surface phase; C60; Fullerenes; Scanning tunnelling microscopy; Silicon; 3 3 Reconstruction
Indexed keywords
CRYSTAL GROWTH; HEAT TREATMENT; PASSIVATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;
SURFACE PHASES;
FULLERENES;
EID
:
0037074766
PISSN
:
09215107
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1016/S0921-5107(01)00841-8
Document Type
:
Conference Paper
Times cited : (
22
)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.
