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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 5 A, 2005, Pages 3226-3234

Scanning tunneling microscopy/spectroscopy of La2@C 72 multilayer islands on Si(100)-2×1-H surfaces

(9) Taninaka, Atsushi a Kato, Haruhito a Shino, Kazuhiro a Sugai, Toshiki a Heike, Seiji b Terada, Yasuhiko b Suwa, Yuji b Hashizume, Tomihiro b Shinohara, Hisanori a

a NAGOYA UNIVERSITY (Japan)

b HITACHI LTD (Japan)

Author keywords

Fullerene; Metallofullerene; STM; STS

Indexed keywords

ELECTRIC CONDUCTIVITY; FULLERENES; NUCLEAR MAGNETIC RESONANCE; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; STRUCTURAL ANALYSIS;

CARRIER CONDUCTION; METALOFULLERENE; STM; STS;

MULTILAYERS;

EID: 22644438264 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.3226 Document Type: Article

Times cited : (5)

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