C60 adsorption on the Si(110)-(16 × 2) surface

Surface Science

Volumn 397, Issue 1-3, 1998, Pages 421-425

  Ma, Y R ^a   Moriarty, P ^a   Upward, M D ^a   Beton, P H ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Adsorption kinetics; Coatings; Fullerenes; Scanning tunneling microscopy; Silicon

Indexed keywords

ADSORPTION; ANNEALING; CRYSTAL ORIENTATION; DESORPTION; FULLERENES; MONOLAYERS; PASSIVATION; PROTECTIVE COATINGS; REACTION KINETICS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; THERMAL EFFECTS;

DISORDERED ORIENTATION;

SEMICONDUCTING SILICON;

EID: 0031992416     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00716-4     Document Type: Article

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