메뉴 건너뛰기




Volumn 368, Issue 1-3, 1996, Pages 330-336

Vibrational study of C60 overlayers on H/Si(111)-(1 × 1)

Author keywords

Electron energy loss spectroscopy; Fullerenes; Infrared absorption spectroscopy; Silicon; Vibrations of adsorbed molecules

Indexed keywords

ADSORPTION; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; INFRARED SPECTROSCOPY; MOLECULAR VIBRATIONS; SEMICONDUCTING SILICON; SURFACES; THIN FILMS;

EID: 0030407597     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)80028-3     Document Type: Article
Times cited : (32)

References (39)
  • 10
    • 47049103961 scopus 로고
    • Eds. H. Ehrenreich and F. Saepen (Academic Press, New York)
    • For reviews, see, for example J.H. Weaver and D.M. Poirier, in: Solid State Physics, Vol. 48, Eds. H. Ehrenreich and F. Saepen (Academic Press, New York, 1994) p. 1; J.E. Fischer, in: The Chemical Physics of Fullerenes: 10 (and 5) Years Later, Ed. W. Andreoni (Kluwer, Dordrecht, 1996) p. 359.
    • (1994) Solid State Physics , vol.48 , pp. 1
    • Weaver, J.H.1    Poirier, D.M.2
  • 11
    • 0039457829 scopus 로고    scopus 로고
    • Ed. W. Andreoni (Kluwer, Dordrecht)
    • For reviews, see, for example J.H. Weaver and D.M. Poirier, in: Solid State Physics, Vol. 48, Eds. H. Ehrenreich and F. Saepen (Academic Press, New York, 1994) p. 1; J.E. Fischer, in: The Chemical Physics of Fullerenes: 10 (and 5) Years Later, Ed. W. Andreoni (Kluwer, Dordrecht, 1996) p. 359.
    • (1996) The Chemical Physics of Fullerenes: 10 (and 5) Years Later , pp. 359
    • Fischer, J.E.1
  • 19
    • 0001169459 scopus 로고
    • A.J. Maxwell, P.A. Brühwiler, A. Nilsson, N. Mårtensson and P. Rudolf, Phys. Rev. B 49 (1994) 10717; M. Pedio, M.L. Grilli, C. Ottaviani, M. Capozi, C. Quaresima, P. Perfetti, P.A. Thiry, R. Caudano and P. Rudolf, J. Electron Spectrosc. Relat. Phenom. 76 (1995) 405.
    • (1994) Phys. Rev. B , vol.49 , pp. 10717
    • Maxwell, A.J.1    Brühwiler, P.A.2    Nilsson, A.3    Mårtensson, N.4    Rudolf, P.5
  • 23
    • 0000374584 scopus 로고
    • See, for example, H. Xu, D.M. Chen and W.N. Creager, Phys. Rev. Lett. 70 (1993) 1850; Y.Z. Li, M. Chander, J.C. Patrin, J.H. Weaver, L.P.F. Chibante and R.E. Smalley, Phys. Rev. B 45 (1992) 13837.
    • (1993) Phys. Rev. Lett. , vol.70 , pp. 1850
    • Xu, H.1    Chen, D.M.2    Creager, W.N.3
  • 38
    • 0003926106 scopus 로고
    • Verlag Chemie
    • The domain size can be evaluated from the equation D = λ/(2Δθ cos θ), where λ is the De Brogue wavelenth of the incident electron λ(Å) = 12.2/√E(eV) = 5.46 Å, Δθ is the increase in angular width corresponding to 0.019 in our case, and θ is the incidence angle corresponding to 45° (see G. Ertl and J. Küppers, Low Energy Electrons and Surface Chemistry, (Verlag Chemie, 1974).
    • (1974) Low Energy Electrons and Surface Chemistry
    • Ertl, G.1    Küppers, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.