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Volumn 564, Issue 1-3, 2004, Pages 156-164

Morphology, structure, and electronic properties of Ce@C82 films on Ag:Si(1 1 1)-(√3×3)R30°

Author keywords

Fullerenes; Photoemission (total yield); Scanning tunneling microscopy

Indexed keywords

CARBON; FULLERENES; MONOLAYERS; MULTILAYERS; OXIDATION; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON; SILVER; THIN FILMS;

EID: 3242875646     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.189     Document Type: Article
Times cited : (18)

References (33)
  • 21
    • 3242889657 scopus 로고    scopus 로고
    • private communication
    • Cuong Ton-That, private communication (2002).
    • (2002)
    • Ton-That, C.1
  • 28
    • 3242875816 scopus 로고    scopus 로고
    • K. Schulte, L. Wang, M. Kanai, T.J.S. Dennis, J. Anderson, S. Gorovikov, J. Purton, S. Patel, P. Moriarty (unpublished)
    • K. Schulte, L. Wang, M. Kanai, T.J.S. Dennis, J. Anderson, S. Gorovikov, J. Purton, S. Patel, P. Moriarty (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.