Epitaxial C60 thin films on Bi(0 0 0 1)

Surface Science

Volumn 601, Issue 23, 2007, Pages

  Sadowski, J T ^a   Bakhtizin, R Z ^b   Oreshkin, A I ^c   Nishihara, T ^a   Al Mahboob, A ^a   Fujikawa, Y ^a   Nakajima, K ^a   Sakurai, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c Birsk Branch of Federal State Budgetary Educational Establishment of Higher Education Bashkir State University   (Russian Federation)

Author keywords

Epitaxy; Fullerenes; Low energy electron diffraction (LEED); Low energy electron microscopy (LEEM); Scanning tunneling microscopy

Indexed keywords

BISMUTH; CHARGE TRANSFER; ELECTRON MICROSCOPES; EPITAXIAL GROWTH; FULLERENES; LOW ENERGY ELECTRON DIFFRACTION; NUCLEATION; SCANNING TUNNELING MICROSCOPY;

LOW-ENERGY ELECTRON MICROSCOPY (LEEM); MULTIPLE STEPS;

EPITAXIAL FILMS;

EID: 36248953944     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.10.005     Document Type: Article

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