Investigation of the interaction between a C60 epitaxial film and a Si(1 1 1)-7 × 7 surface by electron energy loss spectroscopy

Surface Science

Volumn 518, Issue 1-2, 2002, Pages 126-132

  Iizumi, Ken Ichi ^a   Saiki, Koichiro ^a   Koma, Atsushi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Electron energy loss spectroscopy (EELS); Epitaxy; Fullerenes; Silicon; Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; FULLERENES; SILICON;

EPITAXIAL FILMS;

SURFACE PHENOMENA;

EID: 0037057511     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02120-9     Document Type: Article

References (27)

1. Wertheim G.K., Buchanan D.N.E. Phys. Rev. B. 50:1994;11070.
2. Tsuei K.-D., Yuh J.-Y., Tzeng C.-T., Chu R.-Y., Chung S.-C., Tsang K.-L. Phys. Rev. B. 56:1997;15412.
3. Maxwell A.J., Brühwiler P.A., Andersson S., Arvanitis D., Hernnäs B., Karis O., Mancini D.C., Mårtensson N., Gray S.M., Johansson M.K.-J., Johansson L.S.O. Phys. Rev. B. 52:1995;R5546.
4. Cepek C., Goldoni A., Modesti S. Phys. Rev. B. 53:1996;7466.
5. Cepek C., Vobornik I., Goldoni A., Magnano E., Selvaggi G., Kröger J., Panaccione G., Rossi G., Sancrotti M. Phys. Rev. Lett. 86:2001;3100.
6. Xu H., Chen D.M., Creager W.N. Phys. Rev. Lett. 70:1993;1850.
7. Suto S., Sakamoto K., Wakita T., Hu C.-W., Kasuya A. Phys. Rev. B. 56:1997;7439.
8. Sakamoto K., Harada M., Kondo D., Kimura A., Kakizaki A., Suto S. Phys. Rev. B. 58:1998;13951.
9. Moriarty P., Upward M.D., Dunn A.W., Ma Y.-R., Beton P.H., Teehan D. Phys. Rev. B. 57:1998;362.
10. Cepek C., Schiavuta P., Sancrotti M., Pedio M. Phys. Rev. B. 60:1999;2068.
11. Sakamoto K., Kondo D., Takeda H., Sato T., Suga S., Matsui F., Amemiya K., Ohta T., Uchida W., Kasuya A. Surf. Sci. 493:2001;604.
12. Fujikawa Y., Saiki K., Koma A. Phys. Rev. B. 56:1997;12124.
13. Netzer F.P. Ferreira J.G., Ramos M.T. X-ray Spectroscopy in Atomic and Solid State Physics. NATO ASI Series B: Physics. vol. 187:1987;335 Plenum Press, New York.
14. Saiki K., Tokoro T., Koma A. Jpn. J. Appl. Phys. 26:1987;L974.
15. Ertl G., Kuppers J. Low Energy Electron and Surface Chemistry. 1974;7 Verlag Chemie, Weinheim.
16. Koma A., Miki K. Appl. Phys. A. 34:1984;35.
17. Lucas A., Gensterblum G., Pireaux J.J., Thiry P.A., Caudano R., Vigneron J.P., Lambin Ph., Krätschmer W. Phys. Rev. B. 45:1992;13694. and references there in.
18. Ueno K., Uchino Y., Iizumi K., Saiki K., Koma A. Appl. Surf. Sci. 169-170:2001;184.
19. Sohmen E., Fink J. Phys. Rev. B. 47:1993;14532.
20. Kuzuo R., Terauchi M., Tanaka M., Saito Y., Shinohara H. Phys. Rev. B. 49:1994;5054.
21. Tzeng C.-T., Lo W.-S., Yuh J.-Y., Chu R.-Y., Tsuei K.-D. Phys. Rev. B. 61:2000;2263.
22. Sohmen E., Fink J., Krätschmer W. Europhys. Lett. 17:1991;51.
23. Itchkawitz B.S., Long J.P., Shedel-Niedrig T., Kabler M.N., Bradshaw A.M., Schlögl R., Hunter W.R. Chem. Phys. Lett. 243:1995;211.
24. Jost M.B., Troullier N., Poirier D.M., Martins J.L., Weaver J.H., Chibante L.P.F., Smalley R.E. Phys. Rev. B. 44:1991;1966.
25. Weaver J.H. J. Phys. Chem. Solids. 53:1992;1433.
26. Zangwill A. Physics at Surfaces. 1988;224 Cambridge University Press.
27. Iizumi K., Ueno K., Saiki K., Koma A. Appl. Surf. Sci. 169-170:2001;142.